Semiconductor inspection fixture "probe card"
Achieved a minimum pitch of 30μm matrix! Semiconductor test fixtures capable of narrow pitch probe settings.
A "probe card" is a tool used in the semiconductor testing process for electrical testing of LSI (large-scale integrated circuit) chips formed on silicon wafers during the wafer test process of LSI manufacturing. By using wire probes, it is possible to position the probes vertically, allowing for more flexible probe arrangements. Additionally, by making vertical contact with the test object, significant improvements in inspection marks (dents) compared to conventional cantilever-type probes can be expected. 【Features】 ■ Vertical contact ■ Pin pitch ■ Multi-pin configuration, multi-surface simultaneous measurement *For more details, please download the PDF or feel free to contact us.
- Company：コーヨーテクノス
- Price：Other
